Short name:
SMPS

Full name:
TSI Scanning Mobility Particle Sizer

What is being measured:

Sampling Protocol:
Online

Manufacturer:
TSI

Model:
3080 (Electrostatic Classifier), 3775 (CPC), 3081 (DMA)

Instrument year :
2012

Data recording software:
AIM

Data analysis software:
Igor (custom procedure)

Raw data time resolution:
2 mins

Analysis data averaging:
NA

Detection limit:
1 particle/cc (mass, volume, surface area is size-distribution dependent)

Sensitivity to temperature (and correction method, if applicable): :
None that we are aware of. The SMPS is operated within the temperature-controlled chamber enclosure and sample flow is not dried, unless otherwise noted.

Sensitivity to relative humidity (and correction method, if applicable): :
None that we are aware of. The SMPS is operated within the temperature-controlled chamber enclosure and sample flow is not dried, unless otherwise noted.

Sampling method:
0.3 lpm through ¼” OD stainless steel tube, ~1.5 m

Sample preparation method:
NA

Sample residence time (chamber to instrument) (seconds):

Length of tubing (cm):

Instrument flow rate:

Tubing inner diameter:

Tubing material:
Stainless Steel

Chemical identification method:
NA

Data analysis method:
SMPS data exported from TSI AIM software to text file as dN/dLogDm (particles per cm^3). Text file loaded by custom Igor loader/plotter. Integrated number, surface area, volume, concentration time series calculated. Condensational sink rate coefficient calculated using size distribution and Fuchs Sutergin correction applied.

Quantification method:
NA

Calibration method:
Sizing checked/ calibrated with PSL calibration spheres (3 sizes: 100 – 500 nm) biannually, CPCs cross-compared biannually (factory calibration as needed, ~3 yrs)

Calibration drift estimate:
Low (on the order of weeks)

Calibration schedule:
As Needed

Uncertainty estimation method:
Standard for SMPSs (discussed in literature)

Known interferences:
None known

Link to supplemental information:

Additional notes:
Typically particle scans are ~10-600 nm.

Measurement uncertainty:

Measurement units: