Instrument - Parameterization of vapor wall loss
Short name:
Vapor wall loss
Full name:
Parameterization of vapor wall loss
What is being measured:
Wall deposition rates of volatile chemicals
Sampling Protocol:
Online
Manufacturer:
Custom
Model:
Custom
Instrument year
:
None specified
Data recording software:
Inquire with PI
Data analysis software:
Inquire with PI
Raw data time resolution:
Inquire with PI
Analysis data averaging:
Inquire with PI
Detection limit:
Inquire with PI
Sensitivity to temperature (and correction method, if applicable):
:
Sensitivity to relative humidity (and correction method, if applicable):
:
Sampling method:
Direct sampling
Sample preparation method:
None
Sample residence time (chamber to instrument) (seconds):
Length of tubing (cm):
Instrument flow rate:
Tubing inner diameter:
Tubing material:
Chemical identification method:
Chemicals were synthesized and introduced
Data analysis method:
Chemical loss rates from experiments performed at various relative humidity conditions were fitted with an exponential model in Matlab.
Quantification method:
Quantification in CIMS were performed by applying a humidity-dependent sensitivity factor and correcting for dilution ratio.
Calibration method:
Loss rates do not require calibration
Calibration drift estimate:
Calibration schedule:
Uncertainty estimation method:
Inquire with PI
Known interferences:
Link to supplemental information:
https://pubs.rsc.org/en/content/articlehtml/2016/cp/c6cp00053c
Additional notes:
Measurement uncertainty:
Measurement units: