Instrument - Parameterization of vapor wall loss

Short name:
Vapor wall loss

Full name:
Parameterization of vapor wall loss

What is being measured:
Wall deposition rates of volatile chemicals

Sampling Protocol:



Instrument year :
None specified

Data recording software:
Inquire with PI

Data analysis software:
Inquire with PI

Raw data time resolution:
Inquire with PI

Analysis data averaging:
Inquire with PI

Detection limit:
Inquire with PI

Sensitivity to temperature (and correction method, if applicable): :

Sensitivity to relative humidity (and correction method, if applicable): :

Sampling method:
Direct sampling

Sample preparation method:

Sample residence time (chamber to instrument) (seconds):

Length of tubing (cm):

Instrument flow rate:

Tubing inner diameter:

Tubing material:

Chemical identification method:
Chemicals were synthesized and introduced

Data analysis method:
Chemical loss rates from experiments performed at various relative humidity conditions were fitted with an exponential model in Matlab.

Quantification method:
Quantification in CIMS were performed by applying a humidity-dependent sensitivity factor and correcting for dilution ratio.

Calibration method:
Loss rates do not require calibration

Calibration drift estimate:

Calibration schedule:

Uncertainty estimation method:
Inquire with PI

Known interferences:

Link to supplemental information:

Additional notes:

Measurement uncertainty:

Measurement units:

Vapor Loss Characterizations:
2015-05-11 (#6)