Name:
Vapor wall loss RH parameterization for HMHP, HCOOH, H2O2

Instrument:
Chemical Ionization Mass Spectrometer with CF3O-

Chamber:
Near/Far Bag 2012-2015 (Tran)

Temperature (°C):
24

Relative humidity (%):
90

Volatile compound name or class:
HMHP, H2O2, HCOOH

Volatile compound source:

• In-situ formation via reaction

Date of characterization experiment:
2016-05-11

Months since calibration:

Wall loss experiment description:
HMHP, HCOOH, and H2O2 were made in the chamber at different RH and the loss observed. Then the trend with respect to RH was reported

Vapor loss calculation method:
Fitted the amount of chemical remaining with time for the loss rate in per minute

Parameterization developed:
Yes

Parameterization description:
The parameterization is a linear trend with relative humidity, after the individual loss rates were obtained, then the RH dependence was fitted using the linear least squares method

Link to supplemental information:

Additional notes:

Characterization data file:
Vapor_Wall_Loss_20160511_HCOOH_HMHP_H2O2.csv